Ultrafast Carrier Trapping of a Metal-Doped Titanium Dioxide Semiconductor Revealed by Femtosecond Transient Absorption Spectroscopy

Publication in the ACS Applied Materials & Interfaces

6/12/2014
Ultrafast Carrier Trapping of a Metal-doped Titanium Dioxide Semiconductor Revealed by Femtosecond Transient Absorption Spectroscopy.

Jingya Sun, Yang Yang, Jafar I. Khan, Erkki Alarousu, Zaibing Guo, Xixiang Zhang, Qiang Zhang, and Omar F. Mohammed.

ACS Applied Materials & Interfaces, 6(13), pp 10022-10027, (2014)