Real-space imaging of carrier dynamics of
materials surfaces by second-generation four-dimensional scanning
ultrafast electron microscopy
Jingya Sun, Vasily A. Melnikov, Jafar I. Khan, and Omar F. Mohammed
J. Phys. Chem. Lett., 6(19), pp 3884–3890, (2015)
DOI: 10.1021/acs.jpclett.5b01867
https://doi.org/10.1021/acs.jpclett.5b01867
