X-ray imaging scintillators have gained significant attention in medical radiography, security inspection, and high-energy physics because of their ability to convert high-energy radiation photons into low-energy visible photons, enabling detailed inspection of internal structures in complex devices and organisms. For practical applications, X-ray imaging scintillator screens must combine high sensitivity with exceptional spatial resolution to capture fine imaging details. Addressing these demands, we leverage the tightly interwoven and precisely oriented growth pattern of metal-organic framework (MOF) thin films synthesized via in situ electrochemical methods. This approach significantly improves material density and reduces light scattering, leading to greatly enhanced X-ray imaging performance. Our work underscores the potential of MOF-based scintillators in advancing high-performance X-ray imaging technologies.