Imaging Localized Energy States in Silicon-doped InGaN Nanowires Using 4D Electron Microscopy
Year:
2018
DOI:10.1021/acsenergylett.7b01330 / ACS Energy Letters, 3, 476–481 (2018)
Authors:
R. Bose, A. Adhikari, V.M. Burlakov, G. Liu, M.A. Haque, D. Priante, M.N. Hedhili, N. Wehbe, C. Zhao, H. Yang, T.K. Ng, A. Goriely, O.M. Bakr, T. Wu, B.S. Ooi, O.F. Mohammed
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Ultrafast electron microscopy
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Nanowires